Highlights of the NXT measuring systems:

• Enhances process stability, quality, and production yield

• High measurement stability with respect to height and tilt variation of the sample

• Surface roughness compensation

• Works for all layer types (dielectric, organic, inorganics, metallic & transparent conductive)

• High sensitivity to small thickness variations

• Fast non-destructive measurements

• Unique oscillatory model for offline systems: Optical modeling for evaluation of the spectral n&k of the coating materials

The Xelas SCAN RT-VIS is a spectral reflectance and transmittance measurement system for high-precision thin film control. It allows for single and multi-layer thickness measurements, along with optical modelling for n&k evaluation of coating materials. Its motorized measuring table supports x-y mapping and single-point measurements.